Quartz Sensor Test before installation in Weigh-In-Motion
Weigh-In-Motion
(WIM) is a technology that measures the weight of vehicles while they are in
motion, eliminating the need for vehicles to stop. It uses sensors installed
beneath the road surface to detect pressure changes as vehicles pass over them,
providing real-time data on weight, axle load, and speed. WIM systems are
widely used in traffic management, overload enforcement, and logistics to
improve efficiency and safety.
WIM
offers significant benefits, including reduced traffic disruption, real-time
monitoring, and improved road safety by detecting overloaded vehicles. Among
the various sensor types, quartz sensors are particularly suitable for
High-Speed Weigh-In-Motion (HSWIM) due to their high accuracy, durability, and
ability to withstand harsh environmental conditions. Quartz sensors, such as
the CET8312-A, provide consistent performance even at high speeds, making them
ideal for applications requiring precise and reliable weight measurements in
fast-moving traffic scenarios.
The
following introduces two important testing methods to be conducted before
installing the Quartz Sensor: Insulation Test and Waveform Test.
1.
Insulation Test
Method
1)
Insert sensor Q9
head into megohmmeter socket
2)
Set megohmmeter
to 1000V position (prohibited to use 2500V position)
3)
Turn and press
test switch clockwise, hear "beep" sound, red indicator light in
upper right illuminates to start test, test time should not be less than 5
seconds
4)
Test results as
shown:
- Display
result OL unit (GΩ): Optimal performance
- Display
result 163 unit (MΩ): Cannot be used
2.
Waveform Test
Method
1)
Insert sensor Q9
head into oscilloscope "CH1" socket, adjust time to 200ms and voltage
to 500mv, or adjust according to site conditions
o No signal output as shown above
- Signal output
as shown above
- Positive
waveform
- Negative
waveform
3.
Sensor Quality
Assessment
Insulation
Assessment Standards:
- OL unit GΩ: Optimal performance
- Greater than 10 GΩ: Good
condition
- Less than 1 GΩ: Usable
- 300MΩ and below: Defective (Scrap)
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